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Semiconductor wafer and device process yields are some of the most closely guard

ID: 3128850 • Letter: S

Question

Semiconductor wafer and device process yields are some of the most closely guarded trade secrets in the semiconductor industry, and they measure how well a given semiconductor process can fabricate and package non-defective integrated circuits. Suppose a process used to manufacture CMOS chips produces the following sampling of process yields:

X = {68.5%, 77.2%, 78.6%, 74.3%, 75.4%, 77.4%, 48.6%, 69.7%, 72.7%, 76.2%}

Does the sample provided give any evidence that the mean yield is not 74%? Assume the standard deviation is 2.5%.

a) Findthemeanvalueofthesample.

b) Writeoutthedescriptionofthehypothesistestusingthestandardnotationand state whether it is one-sided or two-sided.

c) TestthehypothesisusingtheP-Valueapproach(hint:youneedtocomputethe z-standard value for the sample mean). What does the computed P-value suggest about the hypothesis?

d) Test the hypothesis using the fixed interval approach. Assume = 0.04. What is / are the z-values of the boundaries of the fixed interval? What does this test suggest about the hypothesis?

e) Suppose the true yield is actually 76%. What is the probability of a type II error under these circumstances? What is the power of this test? How many samples would you need to increase the power of the test to 95%?

f) Compute the 95% confidence intervals for the mean value of the sample. What do the confidence intervals suggest about the hypothesis?

Explanation / Answer

A)

Using technology to find the descriptive statistics,

X = sample mean =    71.86   [ANSWER]

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b)      


Formulating the null and alternative hypotheses,              
              
Ho:   u   =   74  
Ha:    u   =/   74  
              
As we can see, this is a    two   tailed test. [ANSWER]

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c)

Getting the test statistic, as              
              
X = sample mean =    71.86          
uo = hypothesized mean =    74          
n = sample size =    10          
s = standard deviation =    2.5          
              
Thus, z = (X - uo) * sqrt(n) / s =    -2.706909677          
              
Also, the p value is              
              
p =    0.006791273   [P VALUE]

Hence, as P is very small, there is much evidence that the null hypothesis could be incorrect.

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d)      

Thus, getting the critical z, as alpha =    0.04   ,      
alpha/2 =    0.02          
zcrit =    +/-   2.053748911      

As |z| > 2.0537, then there is significant evidence at 0.04 level that the the mean yield is not 74% at 0.04 level. [CONCLUSION]

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